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Study of Recrystallization via Electrical Resistivity Measurements: A novel appr

Description: Study of Recrystallization via Electrical Resistivity Measurements by Sanjay Vajpai Recrystallization has been extensively utilized for variety of materials to modify the microstructure and achieving desired mechanical properties. Therefore, characterization of recrystallization is an important aspect. However, most of the existing characterization techniques are either not in-situ in nature or too complex. In the present work, a novel method of spline-based isogeometric approximation and robust numerical differentiation has been originated and employed to the in-situ resistivity data to characterize recrystallization. It has been shown that this method is able to reveal the elusive effects of recrystallization from the in-situ electrical resistivity measurements. An extensive experimental work on Al-Mg and Al-Mg-Fe-Mn alloys, which are extensively used in automotive industry, showed that this method is sensitive, reliable, accurate and efficient. An extensive literature on the recrystallization and related phenomena, resistivity measurements and cubic splines has also been provided in the book. This work should be useful to the people involved in research and development activities, especially characterization of materials, in industry as well as academia. FORMAT Paperback LANGUAGE English CONDITION Brand New Publisher Description Recrystallization has been extensively utilized for variety of materials to modify the microstructure and achieving desired mechanical properties. Therefore, characterization of recrystallization is an important aspect. However, most of the existing characterization techniques are either not in-situ in nature or too complex. In the present work, a novel method of spline-based isogeometric approximation and robust numerical differentiation has been originated and employed to the in-situ resistivity data to characterize recrystallization. It has been shown that this method is able to reveal the elusive effects of recrystallization from the in-situ electrical resistivity measurements. An extensive experimental work on Al-Mg and Al-Mg-Fe-Mn alloys, which are extensively used in automotive industry, showed that this method is sensitive, reliable, accurate and efficient. An extensive literature on the recrystallization and related phenomena, resistivity measurements and cubic splines has also been provided in the book. This work should be useful to the people involved in research and development activities, especially characterization of materials, in industry as well as academia. Author Biography (Top)Sanjay K Vajpai, BEng, MTech, MASc,is a Research Scholar in Materials and Metallurgical Engineering at IIT Kanpur, India. (Bottom)Dmitri V Malakhov, PhD, is an Associate Professor at McMaster University, Canada. He received his PhD in Chemistry from Russian Academy of Sciences, Novosibirsk. He is an authority on computational thermodynamics. Details ISBN3639182391 Author Sanjay Vajpai Short Title STUDY OF RECRYSTALLIZATION VIA Pages 98 Publisher VDM Verlag Language English ISBN-10 3639182391 ISBN-13 9783639182392 Media Book Format Paperback Year 2009 Subtitle A novel approach based on isogeometric approximation using splines and robust numerical differentiation Publication Date 2009-07-31 UK Release Date 2009-07-31 Imprint VDM Verlag Country of Publication Germany Audience General We've got this At The Nile, if you're looking for it, we've got it. With fast shipping, low prices, friendly service and well over a million items - you're bound to find what you want, at a price you'll love! TheNile_Item_ID:132588567;

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Study of Recrystallization via Electrical Resistivity Measurements: A novel appr

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ISBN-13: 9783639182392

Book Title: Study of Recrystallization via Electrical Resistivity Measurement

Number of Pages: 98 Pages

Language: English

Publication Name: Study of Recrystallization Via Electrical Resistivity Measurements

Publisher: Vdm Verlag

Publication Year: 2009

Subject: Engineering & Technology

Item Height: 229 mm

Item Weight: 154 g

Type: Textbook

Author: Sanjay Vajpai

Item Width: 152 mm

Format: Paperback

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